The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Apr. 13, 2022
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Stéphane Boutinon, Paris, FR;

Marius Peloux, Palaiseau, FR;

Philippe Pinault, Nogent sur Marne, FR;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01);
Abstract

A method for estimating refraction of an eye of an individual, including: a) providing a set of N acquired eccentric photorefraction images of the eye, b) setting values for a set of parameters including at least sphere, c) providing a set of N simulated eccentric photorefraction images, d) determining an estimator of a difference between the set of N acquired eccentric photorefraction images and the set of N simulated eccentric photorefraction images, e) performing an optimization using an optimization algorithm so as to optimize the estimator by adjusting values for the set of parameters and iterating steps c) and d), and f) deducing an estimation of at least one refraction parameter of the eye.


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