The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Nov. 29, 2022
Applicant:

Sunrise Memory Corporation, San Jose, CA (US);

Inventors:

Masahiro Yoshihara, Yokohama, JP;

Tz-Yi Liu, Palo Alto, CA (US);

Raul Adrian Cernea, Santa Clara, CA (US);

Eli Harari, Saratoga, CA (US);

Assignee:

SUNRISE MEMORY CORPORATION, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/065 (2023.01); H01L 25/18 (2023.01);
U.S. Cl.
CPC ...
H01L 25/0657 (2013.01); H01L 25/18 (2013.01); H01L 2225/06541 (2013.01);
Abstract

In some embodiments, a memory device implements a tile-based architecture including an arrangement of independently and concurrently operable arrays or tiles of memory transistors where each tile includes memory transistors that are arranged in a three-dimensional array and a localized modular control circuit operating the memory transistors in the tile. The tile-based architecture of the memory device enables concurrent memory access to multiple tiles, which enables independent and concurrent memory operations to be carried out across multiple tiles. The tile-based concurrent access to the memory device has the benefits of increasing the memory bandwidth and lowering the tail latency of the memory device by ensuring high availability of storage transistors. In other embodiments, a memory module includes multiple semiconductor memory dies coupled to a memory controller where the semiconductor memory dies are partitioned into independently accessible memory channels with each memory channel being formed across the multiple semiconductor memory dies.


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