The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 31, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Donghoon Kwon, Hwaseong-si, KR;

Chungki Min, Hwaseong-si, KR;

Kihoon Jang, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10B 43/40 (2023.01); H10B 43/10 (2023.01); H10B 43/27 (2023.01); H10B 43/30 (2023.01); H10B 43/50 (2023.01); H01L 21/768 (2006.01); H01L 23/48 (2006.01); H01L 23/522 (2006.01); H10D 84/01 (2025.01);
U.S. Cl.
CPC ...
H10B 43/40 (2023.02); H10B 43/10 (2023.02); H10B 43/27 (2023.02); H10B 43/30 (2023.02); H10B 43/50 (2023.02); H01L 21/76805 (2013.01); H01L 21/76816 (2013.01); H01L 21/76831 (2013.01); H01L 23/481 (2013.01); H01L 23/5226 (2013.01); H10D 84/0149 (2025.01);
Abstract

A semiconductor device includes: a first substrate; a second substrate including first and second regions; a stack structure in the first region and extending from the first region into the second region, the stack structure including interlayer insulating layers and gate layers, wherein the gate layers include gate pads having a step shape in the second region; a capping insulating layer at least partially covering the stack structure; an upper insulating layer on the stack structure and the capping insulating layer; a peripheral contact structure including a plurality of through-vias contacting the second substrate and spaced apart from the gate layers, and a peripheral contact pattern on the plurality of through-vias and connecting at least a portion of the plurality of through-vias to each other; a memory vertical structure; a support vertical structure; and a gate contact plug on the gate pads to be electrically connected to the gate pads.


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