The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Oct. 14, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Alexandros Manolakos, Escondido, CA (US);

Mukesh Kumar, Hyderabad, IN;

Srinivas Yerramalli, San Diego, CA (US);

Fnu Siddhant, Bangalore, IN;

Guttorm Ringstad Opshaug, Redwood City, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04L 1/00 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); H04L 1/0068 (2013.01); H04L 5/0051 (2013.01);
Abstract

Disclosed are various techniques for wireless communication. In an aspect, a user equipment (UE) measures, during a measurement period that spans multiple measurement opportunities, multiple positioning reference signal (PRS) instances, each PRS instance occupying a different measurement opportunity, to produce a plurality of positioning measurements. A PRS instance can be a PRS resource, a PRS resource set, a PRS frequency layer, a transmission/reception point, or combinations thereof. For each PRS instance measured, the UE determines whether the PRS instance was punctured. Upon a determination that the PRS instance was punctured, the UE discards at least a portion of the positioning measurement and modifies the measurement period, e.g., by restarting the measurement period or extending the measurement period in order to take a measurement of another PRS instance.


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