The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 17, 2023
Interdigital Patent Holdings, Inc., Wilmington, DE (US);
Nazli Khan Beigi, Longueuil, CA;
Jonghyun Park, Syosset, NY (US);
Moon Il Lee, Melville, NY (US);
Paul Marinier, Brossard, CA;
INTERDIGITAL PATENT HOLDINGS, INC., Wilmington, DE (US);
Abstract
Methods and apparatuses for beam failure detection and recovery (BFR) are described. Methods include a wireless transmit/receive unit: receiving configuration information including BFR parameter sets with respective candidate beam reference signals (RSs), measurement criteria and interference criteria; detecting beam failure; determining a first BFR parameter set based on a priority of the first BFR parameter set, wherein the priority of the first BFR parameter set is determined based on which panel of the plurality of antenna panels is active, or on a received indication; on a condition that at least one candidate beam RS in the set of candidate beam RSs of the first BFR parameter set satisfies both the measurement criterion and the interference criterion: selecting a candidate beam RS in the set of candidate beam RSs of the first BFR parameter set that satisfies the measurement criterion and the interference criterion, and indicating the selected candidate beam RS.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile