The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Mar. 04, 2024
Applicants:

Samsung Sdi Co., Ltd., Yongin-si, KR;

Unist (Ulsan National Institute of Science and Technology), Ulsan, KR;

Inventors:

Seong Ho Woo, Yongin-si, KR;

Dae Sik Kim, Yongin-si, KR;

Sung Kook Lee, Yongin-si, KR;

Ji Young Kim, Yongin-si, KR;

Bo Ram Lee, Yongin-si, KR;

Hyun-Wook Lee, Ulsan, KR;

Changhyun Park, Ulsan, KR;

Ukhyun Jung, Ulsan, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 10/42 (2006.01); G06T 7/00 (2017.01); H01M 10/04 (2006.01);
U.S. Cl.
CPC ...
H01M 10/4285 (2013.01); G06T 7/0006 (2013.01); H01M 10/0422 (2013.01); H01M 10/0431 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); Y02E 60/10 (2013.01); Y02P 70/50 (2015.11);
Abstract

A deformation analysis device and a non-destructive analysis method for a secondary battery are capable of accurately diagnosing electrode deformation of the secondary battery using a computed tomography (CT) image. The deformation analysis method for the secondary battery includes performing computed tomography (CT) scanning on each of a first area and a second area of the secondary battery to acquire a first image corresponding to the first area and a second image corresponding to the second area, measuring a first angle from a winding front end to a winding distal end of an electrode of an electrode assembly in the first image and measuring a second angle from the winding front end to the winding distal end of the electrode of the electrode assembly in the second image, and determining that the electrode assembly is deformed if a difference value between the first angle and the second angle is greater than a reference value.


Find Patent Forward Citations

Woo, Seong. (2026). Deformation analysis device and method for secondary battery (U.S. Patent No. 12633582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12633582

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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