The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Apr. 25, 2024
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Junichi Kondo, Hamamatsu, JP;

Takeshi Endo, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2021.01); G01N 27/68 (2006.01); H01J 43/10 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); G01N 27/62 (2013.01); G01N 27/68 (2013.01); H01J 43/10 (2013.01);
Abstract

An ion detector includes a conversion dynode including a conversion region where electrons are emitted by incident ions, an electron multiplier including an electron incident surface on which the electrons are incident, and an aperture electrode including an aperture through which the electrons traveling from the conversion region to the electron incident surface pass. The conversion region is a region protruding toward a space where the electrons are emitted.


Find Patent Forward Citations

Kondo, Junichi. (2026). Ion detector and analyzer (U.S. Patent No. 12633508). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12633508

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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