The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Mar. 18, 2021
Applicants:
National Institute for Materials Science, Tsukuba, JP;
Terabase Inc., Okazaki, JP;
Inventors:
Assignees:
National Institute for Materials Science, Ibaraki, JP;
Terabase Inc., Aichi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/18 (2006.01); H01J 37/073 (2006.01);
U.S. Cl.
CPC ...
H01J 37/18 (2013.01); H01J 37/073 (2013.01); H01J 2237/1825 (2013.01); H01J 2237/186 (2013.01); H01J 2237/188 (2013.01); H01J 2237/28 (2013.01);
Abstract
Provided is an electron gun chamber for a scanning electron microscope with (a) an electron source chamber; (b) an intermediate room; (c) an air lock valve installation part; (d) exhaust holes for a preliminary vacuum exhaust pump; and (e) an opening and closing means.
Zhang, Han. (2026). Electron gun chamber for scanning electron microscope, electron gun containing same, and scanning electron microscope (U.S. Patent No. 12633493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12633493
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile