The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Feb. 24, 2022
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Dustin Michael Sargent, San Diego, CA (US);
Christina Carr, Rescue, CA (US);
Sun Young Park, San Diego, CA (US);
David Gruen, Weston, CT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01); G16H 15/00 (2018.01); G16H 30/20 (2018.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G16H 15/00 (2018.01); G16H 30/20 (2018.01);
Abstract
A system may receive radiology data, outcome data for one or more exams, and elapsed time data for the one or more exams. The system may train a first machine learning algorithm to detect exams that are candidates for cherry-picking using the set of radiology data, outcome, and elapsed time data. The system may further determine, using the radiology data and the first machine learning algorithm, a likelihood that an exam was rejected due to cherry-picking.