The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Jun. 06, 2023
Amazon Technologies, Inc., Seattle, WA (US);
Jwala Dhamala, Sunnyvale, CA (US);
Rahul Gupta, Waltham, MA (US);
Anil K Ramakrishna, Culver City, CA (US);
Qian Hu, Bellevue, WA (US);
Rohit Parimi, Syosset, NY (US);
Li Zhang, Westfield, NJ (US);
Anurag Dwarakanath, Bangalore, IN;
Tamal Krishna Kuila, Chinsurah, IN;
Sai Pritam Varma Penumatsa, Bangalore, IN;
Dongyi He, Medford, MA (US);
Payal Motwani, Revere, MA (US);
Morteza Ziyadi, Los Altos, CA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Techniques for determining that processing with respect to a user input will result in an error and ranking clusters of features associated with the user input based on a likelihood that the feature caused the error are described. The system receives user input data, extracts features corresponding to the user input data, and clusters the features based on a similarity to features of other user inputs. The resulting clusters and the user input data are processed to determine whether processing of the user input data will result in an error and a list of the clusters ranked based on a likelihood that the corresponding feature caused the error. Based on the ranked list of the clusters, an error type is attributed to the error and steps for re-configuring a component causing the error are determined.