The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Aug. 09, 2021
Applicant:

Dürr Dental SE, Bietigheim-Bissingen, DE;

Inventors:

Alexander Hack, Biberach, DE;

Alexander Ladikos, Dachau, DE;

Simon Jagoda, Munich, DE;

Matthias Wieczorek, Munich, DE;

Assignee:

DÜRR DENTAL SE, Bietigheim-Bissingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G06T 7/13 (2017.01); G06T 7/30 (2017.01);
U.S. Cl.
CPC ...
G06V 10/758 (2022.01); G06T 7/13 (2017.01); G06T 7/30 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/30204 (2013.01);
Abstract

This invention is related to a method for determining the storage quality of an X-ray imaging plate, including the steps of: providing a plurality of digital X-ray images of the imaging plate; performing a cross-correlation operation on the X-ray images for relevant image regions; creating feature images from the correlation values; classifying the functionality of a pixel of a feature image based on the number of pixels in the vicinity of the pixel whose correlation value exceeds a correlation threshold. Further, the invention also relates to an apparatus.


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