The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 16, 2023
Applicant:

Our United Corporation, Xi'an, CN;

Inventors:

Hao Yan, Xi'an, CN;

Weiqun Yang, Xi'an, CN;

Chun Luo, Xi'an, CN;

Jinsheng Li, Xi'an, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/46 (2022.01); G06T 7/20 (2017.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06V 10/46 (2022.01); G06T 7/20 (2013.01); G06V 20/52 (2022.01);
Abstract

A method for generating contour data is provided. The method for generating contour data includes acquiring an image-guided contour of a target object, the image-guided contour including a target to be monitored; setting a contour type of the image-guided contour to be an image-guided type, which is customized in a contour type in contour data, wherein the image-guided contour of the image-guided type is intended to monitor motion of the target to be monitored of the target object; and saving contour data corresponding to the image-guided contour of the image-guided type in contour data of the target object.


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