The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jan. 16, 2024
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Bartłomiej Wronski, Brooklyn, NY (US);

Matthew Milton Pharr, Oakland, CA (US);

Marco Salvi, Kirkland, WA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/04 (2011.01);
U.S. Cl.
CPC ...
G06T 15/04 (2013.01);
Abstract

Stochastic texture filtering introduces randomness into texel sampling and/or filtering. Instead of computing a closest texel for the texture coordinates, randomness is introduced by stochastic sampling to obtain one texel. Stochastic sampling is also applied for filtering the texels when multiple samples are used and/or to perform temporal filtering. A first technique is used for discrete filters and filter-specific sample weights are generated. In contrast with conventional techniques, the sample weights are not applied directly to the single texel value. The single texel is randomly selected for each pixel, with probability proportional to an associated sample weight. A second technique is used for continuous filters and weights are not generated. Instead, the texture coordinates are perturbed with a random offset, which is drawn from a filter-specific probability distribution. Stochastic texture filtering improves the performance of texture filtering in terms of speed and quality and is compatible with image reconstruction techniques.


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