The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Mar. 21, 2023
Applicant:

Wuhan United Imaging Life Science Instrument Co., Ltd., Hubei, CN;

Inventors:

Tan Xu, Wuhan, CN;

Jinglu MA, Shanghai, CN;

Wenting Xu, Wuhan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 11/005 (2013.01);
Abstract

The present disclosure provides systems and methods for material decomposition. The systems may obtain scan projection data of a target object. The systems may determine corrected projection data by correcting, based on one or more pixel parameters, the scan projection data. The systems may also determine a reconstructed image by performing, based on the corrected projection data, image reconstruction. The systems may further determine density distribution images of at least two target materials of the target object by decomposing the reconstructed image.


Find Patent Forward Citations

Xu, Tan. (2026). Systems and methods for material decomposition (U.S. Patent No. 12633022). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12633022

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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