The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Aug. 03, 2023
Nidek Co., Ltd., Gamagori, JP;
Yoshiyuki Yamada, Gamagori, JP;
NIDEK CO., LTD., Gamagori, JP;
Abstract
An ophthalmic information processing method includes: acquiring first distribution data representing two-dimensional distribution of first measurement data of examinee's eye-tissue; acquiring second distribution data representing two-dimensional distribution of second measurement data of a measurement target different from that of the first measurement data in the examinee's eye tissue, the two-dimensional distribution being related to a region overlapping with that of the first distribution data; generating a first isoline map in which pixels in a closed section enclosed by an isoline are filled with a color or density level in accordance with a value of the first measurement data, the first isoline map representing the first distribution data; generating a wireframe second isoline map in which a closed section enclosed by adjacent isolines are not filled, the second isoline map representing the second distribution data; and generating a superimposed map by superimposing the first isoline map and the second isoline map.