The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 10, 2025
Alpha Networks Inc., Hsinchu, TW;
ALPHA NETWORKS INC., Hsinchu, TW;
Abstract
A method of measuring an offset of an optical axis of an imaging system is implemented by a computing device. The imaging system captures a reference central marker and two reference outer markers on a surface to obtain a captured central marker and two captured outer markers on an image. The imaging system is rotated by a target angle such that the captured central marker is located at a center point of the image. The method includes: obtaining an input of an FOV of the imaging system, and a pair of distances from the reference central marker to each of the reference outer markers, or to each of the captured outer markers; based on the FOV and the pair of distances, obtaining a value of the target angle; and obtaining the offset based on the value of the target angle and an EFL of the imaging system.