The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Jan. 28, 2021
Beijing Zhongxiangying Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Yaoping Wang, Beijing, CN;
Zhaoyue Li, Beijing, CN;
Haodong Yang, Beijing, CN;
Meijuan Zhang, Beijing, CN;
Dong Chai, Beijing, CN;
Hong Wang, Beijing, CN;
Beijing Zhongxiangying Technology Co., Ltd., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A method and device for detecting a defect and method for training a model are provided. The method for detecting the defect includes: acquiring a sample data set and identifying feature information of the sample data set; acquiring an initial model; configuring a training parameter based on the feature information; obtaining a target model by training, according to the training parameter, the initial model with the sample data set; and obtaining defect information of a product by inputting real data of the product into the target model. The training parameter includes at least one of a learning rate descent strategy, a total number of training rounds and a test strategy, the learning rate descent strategy includes a number of learning rate descents and a round number when a learning rate descends, and the test strategy includes a number of tests and a round number when testing.