The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 10, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Kohei Iwabuchi, Kanagawa, JP;
Yuuichi Nitto, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 3/04817 (2022.01); G06T 5/50 (2006.01); G06T 7/90 (2017.01); G09G 5/373 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06F 3/04817 (2013.01); G06T 5/50 (2013.01); G06T 7/90 (2017.01); G09G 5/373 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20221 (2013.01); G09G 2340/04 (2013.01);
Abstract
An image processing apparatus comprises a display control unit that displays defect information detected from an image in which an inspection target is captured, on a display unit in association with the image. The display control unit controls a method of displaying the defect information based on a display size of at least one of the image and the defect information.