The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 03, 2023
Tencent Cloud Computing (Beijing) Co., Ltd., Beijing, CN;
Boshen Zhang, Beijing, CN;
Yabiao Wang, Beijing, CN;
Chengjie Wang, Beijing, CN;
Jilin Li, Beijing, CN;
Feiyue Huang, Beijing, CN;
Tencent Cloud Computing (Beijing) Co., Ltd., Beijing, CN;
Abstract
An image processing method and apparatus that includes: performing feature extraction processing on N image regions of a to-be-processed image respectively to obtain feature data corresponding to the N image regions respectively, N being an integer greater than or equal to 1, performing defect detection on the N image regions respectively according to the feature data corresponding to the N image regions respectively to obtain a prediction probability of a defect in each of the N image regions, obtaining attention for each image region, adjusting the prediction probability of the defect in each image region according to the attention for each image region, and generating a prediction result of the to-be-processed image according to the adjusted prediction probability of each image region.