The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Oct. 12, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Tomotaka Nagashima, Kyoto, JP;

Takahide Hatahori, Kyoto, JP;

Hisanori Morita, Kyoto, JP;

Kenji Takubo, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G01N 21/45 (2006.01); G01N 21/88 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G01N 21/45 (2013.01); G01N 21/88 (2013.01); G06T 5/50 (2013.01); G01N 2201/02 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An inspection system includes an image processing unit that suppresses noise of a complex number image on which pixels are represented by a complex number indicating a periodic change in a vibration state of an inspection target. The image processing unit acquires a degree of similarity between a pixel included in a target image region defined in the complex number image and a pixel included in a plurality of reference image regions defined in the complex number image separately from the target image region by comparing complex numbers representing pixels, and executes noise suppression processing of the target image region by using a weight based on the acquired degree of similarity.


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Nagashima, Tomotaka. (2026). Inspection system, image processing method, and defect inspection device (U.S. Patent No. 12632931). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12632931

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