The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Feb. 16, 2022
Applicant:

S&p Global Inc., New York, NY (US);

Inventors:

Yili Zhang, Logan, UT (US);

Jia Zhao, Logan, UT (US);

Giles Thompson, London, GB;

Lapo Guadagnuolo, London, GB;

Marcus Isaac Daley, Provo, UT (US);

Assignee:

S&P Global Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2023.01); G06N 10/00 (2022.01); G06N 10/20 (2022.01); G06Q 10/0635 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06N 10/20 (2022.01);
Abstract

A computer-implemented method for calculating risk is provided. The method comprises receiving, at a first time, respective deterministic values for a number of factors. Over an evolution time interval starting at the first time, respective stochastic quantum values are generated for each factor from the deterministic values. Each factor is represented by a respective N-qubit quantum circuit, wherein each qubit represents a risk level. The quantum values for the factors are combined into an intermediate quantum risk value at a second time at the end of the evolution time interval. The intermediate quantum risk value according is then modified to a number of classical parameters, and a final stochastic quantum risk value at the second time is generated from the modified intermediate quantum risk value.


Find Patent Forward Citations

Zhang, Yili. (2026). Quantum rating framework (U.S. Patent No. 12632813). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12632813

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…