The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Mar. 04, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dinesh C. Verma, New Castle, NY (US);

Supriyo Chakraborty, White Plains, NY (US);

Shiqiang Wang, White Plains, NY (US);

Augusto Vega, Poway, CA (US);

Hazar Yueksel, San Francisco, CA (US);

Ashish Verma, Nanuet, NY (US);

Pradip Bose, Yorktown Heights, NY (US);

Jayaram Kallapalayam Radhakrishnan, Pleasantville, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 3/045 (2023.01); G06N 3/098 (2023.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 3/098 (2023.01); G06N 3/045 (2023.01);
Abstract

Second machine learning models trained using respective second data sets can be received. The second machine learning models can be run using a first data set used in training a first machine learning model, where the second machine learning models produce respective outputs. Scores associated with the second machine learning models can be determined by comparing the respective outputs with ground truth associated with the first data set. Based on the scores associated with the second machine learning models, whether the first data set is to be discarded or kept can be determined for training the first machine learning model.


Find Patent Forward Citations

Loading…