The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Feb. 01, 2022
Hitachi, Ltd., Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An abnormality degree calculation system includes a concept classification assignment unit that assigns a predetermined concept classification based on an identification number of a target device, a feature value vector extraction unit that extracts a feature value vector based on sensor data of a sensor corresponding to the target device, a likelihood calculation unit that calculates a likelihood of the feature value vector by using a machine learning model obtained from a learning database, a loss calculation unit that calculates a loss using a loss function as a function of the likelihood, a model update unit that updates the model by using the loss and a model, a re-learning necessity determination unit that determines whether re-learning is necessary from the calculated likelihood when an abnormality of the target device is detected, and an abnormality degree calculation unit that calculates an abnormality degree when the re-learning is unnecessary.