The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Dec. 04, 2019
Applicant:

Alpine Quantum Technologies Gmbh, Innsbruck, AT;

Inventors:

Andreas Elben, Donaueschingen, DE;

Christian Kokail, Innsbruck, AT;

Rick Van Bijnen, Innsbruck, AT;

Benoît Vermersch, Coublevie, FR;

Peter Zoller, Innsbruck, AT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/60 (2022.01);
U.S. Cl.
CPC ...
G06N 10/60 (2022.01);
Abstract

A method includes providing a first quantum state at a first node, transforming the first quantum state to obtain a first plurality of transformed quantum states, and measuring the first plurality of transformed quantum states to obtain a first set of measurement results. The method further includes providing a second quantum state at a second node, transforming the second quantum state to obtain a second plurality of transformed quantum states, the second plurality of unitary operations corresponding to the first plurality of unitary operations, and measuring the second plurality of transformed quantum states to obtain a second set of measurement results. A similarity measure between the first quantum state and the second quantum state is determined in terms of the first set of measurement results and the second set of measurement results, the similarity measure including a trace product of the first quantum state and the second quantum state.


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