The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jun. 26, 2020
Applicant:

Oracle International Corporation, Redwood City, CA (US);

Inventors:

Jean-Baptiste Frederic George Tristan, Burlington, MA (US);

Michael Louis Wick, Lexington, MA (US);

Stephen J. Green, Burlington, MA (US);

Assignee:

Oracle International Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/2453 (2019.01); G06F 16/2457 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 16/24545 (2019.01); G06F 16/24578 (2019.01); G06N 20/00 (2019.01);
Abstract

A fairness metric of decisions pertaining to a plurality of candidates indicated in a data set is estimated. Using a Hamiltonian Monte Carlo sampling algorithm, sample sets corresponding to random variables of a null model and an alternate model are obtained. A respective kernel density estimator is fitted on at least some sample sets, and importance sampling is implemented on additional samples generated using the kernel density estimators. The estimated fairness metric is provided via one or more programmatic interfaces.


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