The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jan. 09, 2025
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xue Ying Zhang, Xi'an, CN;

Jing James Xu, Xi'an, CN;

Si Er Han, Xi'an, CN;

Xiao Ming MA, Xi'an, CN;

Wen Pei Yu, Xi'an, CN;

Jing Xu, Xi'an, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/215 (2019.01); G06F 16/23 (2019.01); G06F 16/2458 (2019.01); G06F 16/25 (2019.01); G06F 16/28 (2019.01); G06F 18/15 (2023.01); G06F 18/2113 (2023.01); G06N 3/088 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 18/15 (2023.01); G06F 16/215 (2019.01); G06F 16/2365 (2019.01); G06F 16/2462 (2019.01); G06F 16/258 (2019.01); G06F 16/283 (2019.01); G06F 18/2113 (2023.01); G06N 3/088 (2013.01); G06N 20/00 (2019.01);
Abstract

Systems, methods, and computer program products for generating data according to patterns of missing data. A method for automatically identifying patterns of missing data and generating data accordingly may comprise reading a plurality of values, each associated a subject and a variable; determining a count of missing values for each variable; selecting one or more variables of the plurality of variables based on their respective counts of missing values; identifying a pattern type characterizing a pattern of missing values for each of the one or more selected variables; and generating simulated data for each of the one or more selected variables based on the identified pattern types.


Find Patent Forward Citations

Loading…