The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Feb. 01, 2023
Oracle International Corporation, Redwood Shores, CA (US);
Kripa Kanchana Sivakumar, Seattle, WA (US);
Mayoor Rao, San Jose, CA (US);
John Backof, Tiburon, CA (US);
Andrew Ioannou, San Francisco, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques related to a hybrid approach for measuring statistical drift and data quality on large datasets are provided. In one technique, a data monitoring definition is accessed that includes predefined configuration data and a custom configuration data that is specified by a user, wherein the custom configuration data includes custom instructions pertaining to one or more of data reading, metrics generation, or data writing. Based on the data monitoring definition, executable code is generated that comprises a data reading portion, a metrics generation portion, and a data writing portion. Executing the executable code comprises: based on the data reading portion, reading a dataset based on location data specified in the monitoring definition; based on the metrics generation portion, generating a set of metrics based on the dataset; and based on the data writing portion, writing a result that is based on the set of metrics.
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