The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Apr. 25, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Erik P. Smith, Douglas, MA (US);

Edward Henry, Jurupa Valley, CA (US);

Gajanan S Natu, Cary, NC (US);

Sumanta Sk Kashyapi, Worcester, MA (US);

David Carl Sydow, Merrimack, NH (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract

A method for generating testing information for prediction model training includes: identifying, by an automated event generation and data labeling (AEGDL) manager, a test case initiation event; in response to the identification: selecting a first test case of a plurality of test cases; identifying a first test configuration cluster (TCC) of a plurality of TCCs based on the test case; performing the first test case in the TCC; generating testing information based on the performing of the first test case in the TCC; and providing the testing information to prediction models for model training.


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