The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Nov. 18, 2022
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Manish Ahuja, Bengaluru, IN;

Kanchanjot Kaur Phokela, New Delhi, IN;

Swapnajeet Gon Choudhury, Bangalore, IN;

Kapil Singi, Bangalore, IN;

Kuntal Dey, Birbhum, IN;

Vikrant Kaulgud, Pune, IN;

Mahesh Venkataraman, Bangalore, IN;

Mallika Fernandes, Bangalore, IN;

Reuben Rajan George, Enathu, IN;

Teresa Sheausan Tung, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 9/50 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 9/5072 (2013.01); G06F 11/079 (2013.01);
Abstract

A device may receive system data identifying computational components and software components of a distributed and heterogeneous system executing a hybrid cloud application, and may create digital twins for the computational components and the software components. The device may create a central digital twin to receive functional data, operational data, and key performance indicators (KPIs) from the digital twins, and may create complex KPIs based on the functional data, the operational data, and the KPIs. The device may modify, based on the complex KPIs, one or more of the digital twins to generate additional KPIs, and process the additional KPIs, with a principal component analysis model and a self-organizing maps model, to detect anomalies in the distributed and heterogeneous system. The device may generate, based on the anomalies, a KPI cause vector identifying a root cause associated with the anomalies, and may perform actions based on the root cause.


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