The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Mar. 27, 2023
Applicant:

Velocloud Networks, Llc, Santa Clara, CA (US);

Inventors:

Murtaza Zafer, San Jose, CA (US);

Brennan Marshall Young, San Francisco, CA (US);

Yunxi Li, Fremont, CA (US);

Akhilesh Gadde, Milpitas, CA (US);

Anand Srinivas, San Francisco, CA (US);

Stephen Craig Connors, San Jose, CA (US);

Assignee:

VeloCloud Networks, LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01);
Abstract

Some embodiments of the invention provide a method for remediating anomalies in an SD-WAN implemented by multiple forwarding elements (FEs) located at multiple sites connected by the SD-WAN. The method is performed for each particular FE in a set of one or more FEs. The method identifies a set of metrics associated with each application of multiple applications for which the particular FE forwards traffic flows. For each particular application of the multiple applications, the method generates a distribution graph that shows the identified set of metrics associated with the particular application for the particular FE over a first duration of time. The method analyzes the generated distribution graphs using a machine-trained process to identify one or more per-application incidents by identifying that a threshold number of metrics associated with the particular application (1) are outliers with respect to the generated distribution graph for the particular application and (2) occurred within a second duration of time.


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