The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Dec. 22, 2021
Applicant:

Continental Automotive Systems, Inc., Auburn Hills, MI (US);

Inventors:

Yu Zhu, Vernon Hills, IL (US);

Edward A. Naddeo, Barrington, IL (US);

Wei Zhang, Vernon Hills, IL (US);

Assignee:

AUMOVIO Systems, Inc., Auburn Hills, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0616 (2013.01); G06F 3/0619 (2013.01); G06F 3/0643 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01);
Abstract

The lifespan of flash memory is predicted based on the actual usage profile. Typical use cases are defined. The number of flash memory block writes for each of the typical use cases is collected. Regions of flash memory are defined, wherein each region includes continuous blocks of flash memory and serve a dedicated function in the file system, each functional region are accessed at different frequency, thus region is the smallest and lowest unit where end of life failure of flash part manifests at file system level. During development testing, data is collected to determine a rate at which writes are occurring in each of the regions for each use case and the data is stored in a number-of-writes-per-region-per-use-case table. During use of the electronic device by an end user, occurrences of each of the typical use cases are periodically tracked. An average number of periodical page writes for each of the defined regions of flash memory is calculated. An estimated life span for each region of flash memory is calculated. A flash-file-system-failure date is estimated based on the estimated life span for each region of flash memory. An alert is provided when the flash-file-system-failure date is within a predetermined number of days.


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