The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 06, 2024
Applicant:

SK Hynix Nand Product Solutions Corp., Rancho Cordova, CA (US);

Inventor:

Zion Kwok, Burnaby, CA;

Assignee:

SK Hynix NAND Product Solutions Corp., Rancho Cordova, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0604 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01);
Abstract

This application is directed to data validation in an electronic device. The electronic device identifies a set of check nodes associated with a first variable node that corresponds to a data bit in a block of data, and obtains check node data from each of the set of check nodes. Each check node is associated with a set of respective variable nodes including the first variable node, and the check node data identifies at least a respective target node providing the smallest variable node data among the respective variable nodes. The electronic device identifies a subset of check nodes for each of which the check node data identifies the first variable node as the respective target node, determines that the subset of check nodes includes a first number of check nodes, and determines variable node data of the first variable node based on the first number.


Find Patent Forward Citations

Kwok, Zion. (2026). Self-corrected low-density parity check (ldpc) with index match (U.S. Patent No. 12632172). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12632172

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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