The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Sep. 12, 2025
Applicant:

Rebellions Inc., Seongnam-si, KR;

Inventor:

Seok Joong Hwang, Seoul, KR;

Assignee:

REBELLIONS INC., Seongnam-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0237 (2013.01); G05B 23/0235 (2013.01);
Abstract

The present disclosure relates to an electronic device for performing a defect detection and an operation method thereof, and an operation method of an electronic device including a plurality of processing lanes and at least one additional processing lane according to an example embodiment of the present disclosure includes identifying a lane group including lanes to process identical input data among a plurality of lanes including the plurality of processing lanes and the at least one additional processing lane, identifying, for each of a plurality of lane groups, comparison result data indicating a result of comparison between processing result data of lanes included in each lane group, and detecting whether a defect occurs for at least one of the plurality of lanes based on the comparison result data of the plurality of lane groups.


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