The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Nov. 19, 2022
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Yoshiyuki Okimoto, Nara, JP;
Daijiroh Ichimura, Hyogo, JP;
Akira Minegishi, Osaka, JP;
Yosuke Tajika, Hyogo, JP;
Abstract
A data analysis device, for analyzing efficiency of an assembly line operation including processes, includes: an input interface configured to acquire log data indicating a history of the processes respectively performed for each time of the assembly line operation; and a control circuit configured to generate analysis information indicating an analysis result of the history indicated by the log data, based on information generated by a probability model to calculate probability distribution for the assembly line operation. The probability model is configured to: generate process efficiency distribution indicating probability distribution of efficiency for each process in the assembly line operation, and variation factor distribution indicating probability distribution of a factor probable to vary the efficiency of the assembly line operation in each process; and generate work efficiency distribution indicating probability distribution of the efficiency of the assembly line operation, based on the process efficiency distribution and the variation factor distribution.