The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Nov. 02, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kenichi Ogawa, Yamanashi, JP;

Takashi Nagatomi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4065 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4065 (2013.01); G05B 2219/35111 (2013.01);
Abstract

A machine learning device has an input data acquisition unit that acquires input data including an arbitrary machining condition for an arbitrary workpiece to be machined by an arbitrary machine tool, a cleaning condition for cleaning, by an arbitrary cleaning device, the inside of a machine by which the workpiece was machined under the machining condition and state information indicating a degree of dirtiness of the inside of the machine before the machining under the machining condition. The device also has a label acquisition unit that acquires, as label data, state information about the inside of the machine after machining under the machining condition and cleaning under the cleaning condition included in the input data, and a learning unit that executes supervised learning using the input data and the label data, so as to generate a learned model.


Find Patent Forward Citations

Ogawa, Kenichi. (2026). Machine learning device, cleaning prediction device, and cleaning system (U.S. Patent No. 12632031). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12632031

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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