The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Aug. 30, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Hilmar Gugel, Dossenheim, DE;
Ingo Boehm, Heidelberg, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An optical apparatus for examining a sample includes: an illumination unit for emitting illumination light in an illumination wavelength range onto the sample; a detection unit for collecting detection light in a detection wavelength range from the sample, the illumination wavelength range and the detection wavelength range partially overlapping in an intermediate wavelength range; and a light separating device for separating the illumination light and the detection light, the light separating device including a beam splitter having: a first splitting characteristic with one of transmitting and reflecting light of at least a first polarization state in the illumination wavelength range excluding the intermediate wavelength range; and a polarization-dependent second splitting characteristic with the one of transmitting and reflecting light of the first polarization state and the other of transmitting and reflecting light of a second polarization state in the intermediate wavelength range.