The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Mar. 09, 2023
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Thomas Engel, Aalen, DE;
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Abstract
The invention relates to a calibration target for a Fourier ptychographic imaging system, comprising at least a first plane and a second plane, wherein the first plane and the second plane are parallel to each other and comprise a predefined distance between each other, wherein the first plane comprises a first calibration structure and the second plane comprises a second calibration structure, wherein the first calibration structure is configured to be suitable for centering itself in relation to an optical component and/or a camera of the Fourier ptychographic imaging system, and wherein the second calibration structure is configured to be suitable for determining, directly or in projection onto the first plane, a position of at least one characteristic or predetermined feature of the first calibration structure.