The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Sep. 26, 2022
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventors:
Tim Mayer, Widnau, CH;
Benjamin Schöll, Hauptwil, CH;
Jochen Scheja, Hohenems, AT;
Jürg Hinderling, Marbach, CH;
Assignee:
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01S 7/4814 (2013.01); G01S 17/42 (2013.01);
Abstract
A measuring device comprising a targeting unit and a scanning module. The scanning module bas a field of view with a central line in the field of view. The measuring device has a pivoting axis around which an upper part of the measuring device can be pivoted or rotated. The central line deviates by at most 45 degree from orthogonality with respect to the pivoting axis.