The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Oct. 02, 2020
Otto-von-guericke-universität Magdeburg, Magdeburg, DE;
Otto-von-Guericke-Universität Magdeburg, Madgeburg, DE;
Abstract
The invention relates to a method for operating an imaging examination device (), wherein signals are received from an object () to be examined and are identified and displayed in layers in the form of sectional images and/or three-dimensional images of the object (), having the following steps: ⋅a) ascertaining a desired imaging layer () of the object () to be examined, ⋅b) determining the coordinates of a desired target point () in the desired imaging layer (), ⋅c) determining the coordinates of a corrected target point (') while taking into consideration a distorted gradient field of the examination device () such that the examination device detects an imaging layer on which the desired target point () lies on the basis of the distorted gradient field while using the corrected target point (′) instead of the desired target point (), and ⋅d) detecting an imaging layer () by means of the examination device () using the corrected target point (′) and visualizing an image obtained therefrom.