The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jul. 10, 2023
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

Eric A. Imhof, Albuquerque, NM (US);

Steven Ryan Jefferts, Chatsworth, CA (US);

Thad G. Walker, Middleton, WI (US);

Vyacheslav Lebedev, Redondo Beach, CA (US);

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION, Falls Church, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01); B82Y 20/00 (2011.01);
U.S. Cl.
CPC ...
G01R 29/12 (2013.01);
Abstract

One example includes an electrometer system. The system includes a sensor cell comprising an alkali metal vapor within. The system also includes an excitation beam system configured to provide at least one excitation optical beam through the sensor cell to excite the alkali metal atoms from a ground state to a Rydberg energy state. The system also includes a stimulated emission beam system configured to provide a stimulated emission optical beam through the sensor cell to provide energy decay of the alkali metal atoms to a decay energy state that is less than the Rydberg energy state. The system further includes a detection system configured to monitor fluorescent detection light emitted from the alkali metal atoms as the alkali metal atoms decay from the decay state to the ground state to determine signal characteristics of an external signal based on an intensity of the fluorescent detection light.


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