The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 21, 2023
Shanghai Investigation, Design & Research Institute Co., Ltd., Shanghai, CN;
Tingting Liao, Shanghai, CN;
Songliu Lu, Shanghai, CN;
Lin Lin, Shanghai, CN;
Xiaotao Wu, Shanghai, CN;
Zhiyan Yang, Shanghai, CN;
Huating Xu, Shanghai, CN;
Lin Liu, Shanghai, CN;
Abstract
The method for tracing a sediment source, including: sampling at sampling points and multiple additional testing points around each sampling point; measuring sediment grain size distribution and corresponding mass percentages to plot sediment grain size distribution curves of each sampling point and its additional testing points; plotting a sediment fingerprint matrix of each sampling point; comparing patterns of the sediment fingerprint matrix of the first sampling point with patterns of the sediment fingerprint matrix of the second sampling point, and determining whether sediment at the first sampling point and that at the second sampling point have the same source. The sediment fingerprint matrix that illustrates the variation of sediment characteristics in different grain size intervals. In addition, by comparing the sediment characteristics in the corresponding grain size intervals, the tracing and classification of sediment from different locations can be achieved.