The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Sep. 19, 2023
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masuyoshi Yamada, Tokyo, JP;

Yasutaka Serizawa, Tokyo, JP;

Hisanori Matsumoto, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0008 (2013.01);
Abstract

An easy-to-maintain measurement system including a first sensor that measures a target and outputs a predetermined physical quantity, a second sensor that measures the target and outputs the same type as the predetermined physical quantity, and a processor configured to (1) acquire a first value from the first sensor and a second value from the second sensor, (2) convert the first value to the value of the physical quantity by a first calibration data, (3) calculate second calibration data for the second sensor from the second value and the predetermined physical quantity obtained in step (2), (4) convert the second value to the physical quantity by the second calibration data, and (5) detect the state of the measurement target by an estimation model and the physical quantity obtained in step (4).


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