The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jan. 05, 2024
Applicant:

Korea Electronics Technology Institute, Seongnam-si, KR;

Inventors:

Jin Hyoung Kim, Uiwang-si, KR;

Kyu Sik Shin, Seoul, KR;

Cheol Ung Cha, Seoul, KR;

Kwon Hong Lee, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/22 (2006.01); G01N 15/06 (2006.01); G01N 22/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/222 (2013.01); G01N 15/06 (2013.01); G01N 22/00 (2013.01); G01N 2223/652 (2013.01); G01N 2291/02416 (2013.01);
Abstract

Proposed are a microplastic concentration measurement sensor and a microplastic concentration measurement system using the sensor. The sensor may include a fluidic channel layer having a microfluidic channel formed on an upper surface thereof, and a molding layer formed on the fluidic channel layer and having first through-holes located respectively above one end and other end of the microfluidic channel. The sensor may also include a first substrate layer formed on the molding layer and having second through-holes located respectively above the first through-holes. The sensor may further include a single line formed on an upper surface of the first substrate layer, a second substrate layer formed below the fluidic channel layer, and a resonant layer formed on a lower surface of the second substrate layer.


Find Patent Forward Citations

Kim, Jin. (2026). Microplastic concentration measurement sensor and microplastic concentration measurement system using the same (U.S. Patent No. 12631597). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12631597

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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