The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Jun. 07, 2023
Netzsch-gerätebau Gmbh, Selb, DE;
Ryoichi Kinoshita, Shizuoka, JP;
Kenta Sato, Yokohama, JP;
NETZSCH-Gerätebau GmbH, Selb, DE;
Abstract
To provide a thermal analysis system and a thermal analysis method capable of easily performing thermal analysis while suppressing atmospheric exposure associated with sample movement. A thermal analysis system according to the present disclosure includes a sample preparing unit and a thermal analyzing unit. The sample preparing unit includes a wall portion forming an internal space, a gate portion capable of opening and closing an opening of the wall portion, and a sample holding member including a sample holder and temperature sensors. The thermal analyzer includes a moving mechanism for moving a sample holder into a thermal analysis part, a sealing mechanism for sealing the sample holder from an internal space of a sample preparation part, and a coupling mechanism for connecting a heating tube of the thermal analysis part to a gate part in a state of sealing the heating tube from the outside. A heating tube for housing a sample holder from a sample preparing part and a heating part for heating the heating tube are provided.