The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Mar. 15, 2024
Fujifilm Corporation, Tokyo, JP;
Shuhei Horita, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an inspection support device, an inspection support method, and a program capable of reducing complexity of creating a damage diagram. The inspection support device includes a processor that supports creation of a damage diagram of a structure, in which the processor acquires image data of information including a structural drawing of a target structure on a medium and damage information related to damage added by a user on the medium, recognizes the damage information by image recognition from the acquired image data, acquires drawing data corresponding to the structural drawing, aligns the structural drawing of the image data with the drawing data, and draws the damage information as a damage graphic at a corresponding position of the drawing data to create the damage diagram.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile