The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 12, 2022
Applicant:

Illumisonics Inc., Waterloo, CA;

Inventors:

Parsin Haji Reza, Waterloo, CA;

Kevan Bell, Waterloo, CA;

Benjamin Eccelstone, Waterloo, CA;

Vladimir Pekar, Waterloo, CA;

Nicholas Pellegrino, Waterloo, CA;

Paul Fieguth, Waterloo, CA;

James Alexander Tummon Simmons, Waterloo, CA;

James Tweel, Waterloo, CA;

Assignee:

ILLUMISONICS INC., Waterloo, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); A61B 5/00 (2006.01); G01N 21/47 (2006.01); G06V 10/56 (2022.01); G06V 10/762 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); A61B 5/0071 (2013.01); G01N 21/47 (2013.01); G06V 10/56 (2022.01); G06V 10/762 (2022.01); G06V 20/698 (2022.01);
Abstract

A method of visualizing details in a sample may comprise generating radiative and non-radiative signals in the sample at an excitation location using an excitation beam, interrogating the sample with an interrogation beam directed toward the excitation location of the sample, and detecting light from the sample. The excitation beam may be focused below a surface of the sample. The interrogation beam may be focused below the surface of the sample. The detected light may include a portion of the interrogation beam returning from the sample. The detected light may be indicative of the generated radiative an non-radiative signals.


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