The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Dec. 08, 2021
Applicant:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Inventors:

Matthew Bahr, San Jose, CA (US);

Christopher Ghazi, San Jose, CA (US);

Keegan Owsley, Campbell, CA (US);

Assignee:

BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2024.01); G01F 1/661 (2022.01); G01N 15/10 (2024.01); G01N 15/149 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01F 1/661 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1438 (2013.01); G01N 15/149 (2024.01);
Abstract

Aspects of the present disclosure include methods for determining drop delay of a particle in a flow stream (e.g., in a particle analyzer). Methods according to certain embodiments include irradiating the particle in the flow stream with two or more spatially separated lasers, detecting light from the particle in a first photodetector channel and a second photodetector channel calculating a velocity of the particle in the flow stream based on the detected light in the first photodetector channel and the second photodetector channel and determining the drop delay of the particle based on the calculated velocity. Systems (e.g., particle analyzers) having a light source with two or more spatially separated lasers and a light detection system for practicing the subject methods are also described. Integrated circuits and non-transitory computer readable storage medium having instructions stored thereon for determining drop delay according to the subject methods are also provided.


Find Patent Forward Citations

Loading…