The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jun. 07, 2022
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Daisuke Ebihara, Tokyo, JP;

Shinya Matsuoka, Tokyo, JP;

Mayuko Ito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/40 (2006.01);
U.S. Cl.
CPC ...
G01N 1/4022 (2013.01); G01N 2001/4027 (2013.01);
Abstract

Provided is an evaporative concentration device that can simultaneously perform evaporation concentration on a plurality of samples and individually control the evaporation concentration on each sample. The evaporative concentration device according to the present disclosure includes a first flow path and a second flow path connected in parallel to the same decompression source. A decompression valve is configured to perform an operation of opening and closing the first flow path and an operation of opening and closing the second flow path independently of each other.


Find Patent Forward Citations

Ebihara, Daisuke. (2026). Evaporative concentration device and automatic analysis device (U.S. Patent No. 12631529). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12631529

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…