The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 10, 2024
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Axel Scherer, Barnard, VT (US);

Paromita Mitchell, Pasadena, CA (US);

John Richard Ordonez-Varela, Lescar, FR;

Jack Jewell, Boulder, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/24 (2006.01); G01J 5/08 (2022.01); G01J 5/48 (2022.01); G01J 5/00 (2022.01); G01J 5/20 (2006.01);
U.S. Cl.
CPC ...
G01J 5/24 (2013.01); G01J 5/0896 (2013.01); G01J 5/485 (2022.01); G01J 2005/0077 (2013.01); G01J 2005/204 (2013.01);
Abstract

A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whose temperature is to be monitored. The semiconductor member has a temperature-dependent bandgap with an absorption edge that varies with temperature. A light source is configured to illuminate the semiconductor member with monochromatic light. The monochromatic light has a wavelength equal to an absorption edge wavelength that is associated with the absorption edge when the semiconductor member is at a specified temperature. An imaging device is configured to receive light reflected from the semiconductor member when illuminated with the monochromatic light such that a surface temperature of the object is at the specified temperature when a change in an amount of reflected light that is received indicates that the wavelength of the monochromatic light is equal to the absorption edge wavelength at the specified temperature.


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