The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Jun. 04, 2021
Applicant:
Samsung Display Co., Ltd., Yongin-si, KR;
Inventors:
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); H01L 21/66 (2006.01); H01L 33/00 (2010.01); H10H 20/80 (2025.01);
U.S. Cl.
CPC ...
G01J 1/42 (2013.01); H01L 22/12 (2013.01); H10H 20/80 (2025.01); G01J 2001/4252 (2013.01);
Abstract
An optical inspection device includes an optical measurement unit, a first probe under the optical measurement unit and configured to supply a first voltage, a base frame under the optical measurement unit and spaced from the first probe, and a second probe on a surface of the base frame facing the first probe, configured to supply a second voltage different from the first voltage, and having a plate shape in a plan view.
Yoo, Je. (2026). Optical inspection device and optical inspection method (U.S. Patent No. 12631484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12631484
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